General Information
The IEEE International Mixed-Signals Testing Workshop (IMSTW) is a forum for discussing all aspects of testing, design-for-test and reliable design of integrated mixed-signals/mixed-technology functions and systems.

To register email ann@starkeventsuk.com or telephone +44 141 357 2235.

Key dates
Submission deadline: March 5th, 2006 (extended deadline)
Notification of acceptance: April 7th, 2006
Camera-ready full papers: May 8th, 2006

Topics
Major topics include testing and design verification of monolithic mixed-signal/mixed-technology systems (SoC), heterogeneous systems including system-in-package and printed circuit board implementations of mixed signal functions.
The technology spectrum includes analogue, mixed-signals, high-speed IO, RF, MEMS (inc. optics, bio-chemical and microfluidics), and nanotechnology.
Test topics such as design-for-test techniques, BIST, fault diagnosis, test generation, on-line and off-line testing, fault modelling, fault simulation and design of fault tolerant systems are all considered.
Mixed signals infrastructure, embedded core testing and application specific topics are also welcome.

Sponsors
The IMSTW workshop is held annually, alternating between Europe and North America. The workshop is sponsored by the IEEE Computer Society Test Technology Technical Council.

Commercial Sponsors